de-focus aberration?
ctmckee
Attached is an image i'm trying to improve/correct.... The left image shows the collected image, and the right image shows the image with a threshold overlay. I think the threshold is suggesting there is a de-focus aberration in the optical system that could potentially be described by a Zernike Polynomial. Is there a way to use "ZernikeR(n,m,r) to model/fit and then subtract that aberration?
Thanks,
Clayton
From the apparent symmetry of your thresholded image near the center, if I had to guess, I would suspect a weak stray vignetted reflection. Or is this the "aberrated" feature you wish to correct?
March 8, 2016 at 05:29 am - Permalink
A.G.
WaveMetrics, Inc.
March 9, 2016 at 11:44 am - Permalink
March 16, 2016 at 11:15 am - Permalink
Thanks
March 16, 2016 at 11:19 am - Permalink
The connection with the OP is not immediately obvious.
The documentation defines the rectangularity as a ratio of areas. Once you have the area of the particle, and the pixels that define the limits in the X and Y directions, you can compute the ratio. I think it sounds more complicated than it is.
A.G.
WaveMetrics, Inc.
March 16, 2016 at 01:30 pm - Permalink
I was confused, because the documentation says it is for an "inscribing" rectangle. I assumed that meant that all pixels of the rectangle had to be within the contour of the object. Your response clarifies that the the rectangle is defined by the limits of X and Y points of object; meaning for some objects, portions of the rectangle could lie "outside" the object? Is this a distinction between "inscribing" and "inscribed"?
March 18, 2016 at 09:36 am - Permalink
That is correct. An "inscribing" rectangle is one that contains the whole object, i.e., all pixels of the object lie inside the rectangle but the rectangle may contain pixels that are outside the object.
A.G.
March 18, 2016 at 12:05 pm - Permalink